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A computer vision system for VLSI wafer probing

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A computer vision system for VLSI wafer probing

Dantu, Ramanamurthy V (1990) A computer vision system for VLSI wafer probing. PhD thesis, Concordia University.

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Divisions:Concordia University > Faculty of Engineering and Computer Science > Electrical and Computer Engineering
Item Type:Thesis (PhD)
Authors:Dantu, Ramanamurthy V
Pagination:xii, 148 leaves : ill. ; 29 cm.
Institution:Concordia University
Degree Name:Theses (Ph.D.)
Program:Electrical and Computer Engineering
Date:1990
ID Code:5857
Deposited By:Concordia University Libraries
Deposited On:03 Sep 2009 09:46
Last Modified:08 Dec 2010 10:47
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