Bourassa, Sylvain (1990) Characterization of traps by deep level transient spectroscopy in GaAs epitaxial layers grown by close-spaced vapor transport. Masters thesis, Concordia University.
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| PDF 7Mb |
| Divisions: | Concordia University > Faculty of Engineering and Computer Science > Electrical and Computer Engineering |
|---|---|
| Item Type: | Thesis (Masters) |
| Authors: | Bourassa, Sylvain |
| Pagination: | xiii, 176 leaves : ill. ; 29 cm. |
| Institution: | Concordia University |
| Degree Name: | Theses (M.Eng.) |
| Program: | Electrical and Computer Engineering |
| Date: | 1990 |
| Thesis Supervisor(s): | Lombos, B. A |
| ID Code: | 5861 |
| Deposited By: | Concordia University Libraries |
| Deposited On: | 03 Sep 2009 09:46 |
| Last Modified: | 08 Dec 2010 10:47 |
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