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Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing

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Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing

Khan, Neyaz (1992) Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing. Masters thesis, Concordia University.

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Divisions:Concordia University > Gina Cody School of Engineering and Computer Science > Electrical and Computer Engineering
Item Type:Thesis (Masters)
Authors:Khan, Neyaz
Pagination:xi, 109 leaves : ill. ; 29 cm.
Institution:Concordia University
Degree Name:M.A. Sc.
Program:Electrical and Computer Engineering
Date:1992
Thesis Supervisor(s):Khorasani, K.
Identification Number:QA 76.87 K488 1992
ID Code:2918
Deposited By: Concordia University Library
Deposited On:27 Aug 2009 19:22
Last Modified:13 Jul 2020 19:53
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