Khan, Neyaz (1992) Depth perception from defocus : a neural network based approach for automated visual inspection in VLSI wafer probing. Masters thesis, Concordia University.
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| Divisions: | Concordia University > Gina Cody School of Engineering and Computer Science > Electrical and Computer Engineering |
|---|---|
| Item Type: | Thesis (Masters) |
| Authors: | Khan, Neyaz |
| Pagination: | xi, 109 leaves : ill. ; 29 cm. |
| Institution: | Concordia University |
| Degree Name: | M.A. Sc. |
| Program: | Electrical and Computer Engineering |
| Date: | 1992 |
| Thesis Supervisor(s): | Khorasani, K. |
| Identification Number: | QA 76.87 K488 1992 |
| ID Code: | 2918 |
| Deposited By: | Concordia University Library |
| Deposited On: | 27 Aug 2009 19:22 |
| Last Modified: | 13 Jul 2020 19:53 |
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