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A computer vision system for VLSI wafer probing

Title:

A computer vision system for VLSI wafer probing

Dantu, Ramanamurthy V (1990) A computer vision system for VLSI wafer probing. PhD thesis, Concordia University.

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Divisions:Concordia University > Gina Cody School of Engineering and Computer Science > Electrical and Computer Engineering
Item Type:Thesis (PhD)
Authors:Dantu, Ramanamurthy V
Pagination:xii, 148 leaves : ill. ; 29 cm.
Institution:Concordia University
Degree Name:Ph. D.
Program:Electrical and Computer Engineering
Date:1990
Identification Number:TK 7874 D3 1990
ID Code:5857
Deposited By: Concordia University Library
Deposited On:03 Sep 2009 13:46
Last Modified:13 Jul 2020 20:01
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