Login | Register

Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits


Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits

Narayanan, Rajeev, Zaki, Mohamed H. and Tahar, Sofiène (2010) Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits. Journal of Electronic Testing, 26 (1). pp. 97-109. ISSN 0923-8174

[thumbnail of JETTA-2010.pdf]
Text (application/pdf)
JETTA-2010.pdf - Accepted Version

Official URL: http://dx.doi.org/10.1007/s10836-009-5137-z


Today’s analog/RF design and verification face significant challenges due to circuit complexity, process variations and short market windows. In particular, the influence of technology parameters on circuits, and the issues related to noise modeling and verification still remain a priority for many applications. Noise could be due to unwanted interaction between the circuit elements or it could be inherited from the circuit elements. In addition, manufacturing disparity influence the characteristic behavior of the manufactured circuits. In this paper, we propose a methodology for modeling and verification of analog/RF designs in the presence of noise and process variations. Our approach is based on modeling the designs using stochastic differential equations (SDE) that will allow us to incorporate the statistical nature of noise. We also integrate the device variation due to 0.18μ m fabrication process in an SDE based simulation framework for monitoring properties of interest in order to quickly detect errors. Our approach is illustrated on nonlinear Tunnel-Diode and a Colpitts oscillator circuits.

Divisions:Concordia University > Gina Cody School of Engineering and Computer Science > Electrical and Computer Engineering
Item Type:Article
Authors:Narayanan, Rajeev and Zaki, Mohamed H. and Tahar, Sofiène
Journal or Publication:Journal of Electronic Testing
Digital Object Identifier (DOI):10.1007/s10836-009-5137-z
Keywords:Analog/RF designs Noise modeling Process variation Stochastic differential equation Assertion based verification
ID Code:977364
Deposited By: Danielle Dennie
Deposited On:14 Jun 2013 14:03
Last Modified:18 Jan 2018 17:44


Abercrombie D, Koenemann B (2004) Process/design learning from electrical test. In: IEEE/ACM international conference on computer-aided design, pp 733–738

Accellera (2004) Accellera property specification language. http://www.accellera.org/

Al Sammane G, Zaki M, Dong Z, Tahar S (2007) Towards assertion based verification of analog and mixed signal designs using PSL. In: Forum on specification & design languages, pp 293–298

Ankele B, Hölzl W, O’Leary P (1989) Enhanced MOS parameter extraction and SPICE modeling for mixed signal analogue and digital circuit simulation. In: IEEE international conference on microelectronic test structures, pp 133–137

Bolcato P, Poujois R (1992) A new approach for noise simulation in transient analysis. In: IEEE international symposium on circuits and systems, pp 887–890

Bühler, M, Koehl J, Bickford J, Hibbeler J, Sommer R, Pronath M, Ripp A (2006) DFM/DFY design for manufacturability and yield—influence of process variations in digital, analog and mixed-signal circuit design. In: Conference on design, automation and test in Europe, pp 387–392

Chen WK (2003) VLSI technology (principles and applications in engineering). CRC

Cheng Y (2002) The influence and modeling of process variation and device mismatch on analog/RF circuit design. In: IEEE international caracas conference on devices, circuits and systems TSMC (2008) 0.18μ m CMOS fabrication process. http://www.tsmc.com

Feldmann P, Freund RW (1997) Circuit noise evaluation by Pad eˋ approximation based model-reduction techniques. In: IEEE/ACM international conference on computer-aided design, pp 132–138

Filanovsky IM, Verhoeven CJM, Reja, M (2007) Remarks on analysis, design and amplitude stability of MOS colpitts oscillator. IEEE Trans Circuits Syst-II: Express Briefs 54(9):800–804

freeda TM (2006) freeda homepage. http://www.freeda.org/
Frehse G, Krogh B, Rutenbar R, Maler O (2006) Time domain verification of oscillator circuit properties. Electronic Notes in Theoretical Computer Science 153(3):9–22

Gupta S, Krogh BH, Rutenbar RA (2004) Towards formal verification of analog designs. In: IEEE/ACM international conference on computer aided design, pp 210–217

Ham D, Hajimiri A (2000) Complete noise analysis for CMOS switching mixers via stochasti differential equations. In: IEEE custom integrated circuits conference, pp 439–442
Johns DA, Martin K (1997) Analog integrated circuit design. Wiley, New York

Kinget PR (2005) Device mismatch and tradeoffs in the design of analog circuits. IEEE J Solid-state Circuits 40(6):1212–1224

Kloden PE, Platen E (1995) Numerical solution of stochastic differential equations. Springer, New York

Kolarova E (2005) Modelling RL electrical circuits by stochastic diferential equations. In: International conference on computer as a tool, pp 1236–1238

Kriplani NM, Victor A, Steer MB (2006) Time-domain modelling of phase noise in an oscillator. In: European microwave conference, pp 514–517

Ludwig R, Bretchko P (2004) RF circuit design, theory and applications. Pearson Education, Harlow

Magierowski SK, Zukotynski S (2004) CMOS LC-oscillator phase-noise analysis using nonlinear models. IEEE Trans Circuits Syst 51(4):664–677

Maler O, Nickovic D (2004) Monitoring temporal properties of continuous signals. In: Formal modelling and analysis of timed systems. LNCS, vol 3253, pp 152–166. Springer, New York

Massobrio G, Antognetti P (1988) Semiconductor device modeling with SPICE. McGraw-Hill, New York
The MathWorks (2007) MATLAB User Guide. http://www.mathworks.com/

Oksendal B (2000) Stochastic differential equations. An introduction with applications. Springer, New York

Paper P, Deen MJ, Marinov O (2005) Noise in advanced electronic devices and circuits. In: AIP international conference on noise in physical systems and 1/f fluctuations, vol 780, pp 3–12

Pelgrom M, Tuinhout HP, Vertregt M (1998) Transistor matching in analog CMOS applications. In: International electron devices meeting, pp 915–918

Singhal K, Visvanathan V (1999) Statistical device models from worst case files and electrical test data. IEEE Trans Circuits Syst 12:470–484

Wang Z, Abbasi N, Narayanan R, Zaki M, Al Sammane G, Tahar S (2009) Verification of analog and mixed signal designs using on-line monitoring. In: IEEE mixed-signals, sensors, system test workshop, pp 1–8

Zaki M, Tahar S, Bois G (2008) Formal verification of analog and mixed signal designs: a survey. Microelectron J (Elsevier) 39(12):1395–1404
All items in Spectrum are protected by copyright, with all rights reserved. The use of items is governed by Spectrum's terms of access.

Repository Staff Only: item control page

Downloads per month over past year

Research related to the current document (at the CORE website)
- Research related to the current document (at the CORE website)
Back to top Back to top